Photoluminescence studies on off-stoichiometric defects in sprayed CZTS thin films

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DC Field	Value	Language
dc.contributor.author	Poornima, N	-
dc.contributor.author	Rajeshmon, V G	-
dc.contributor.author	Sudha Kartha, C	-
dc.contributor.author	Vijayakumar, K P	-
dc.date.accessioned	2015-09-01T05:49:05Z	-
dc.date.available	2015-09-01T05:49:05Z	-
dc.date.issued	2014	-
dc.identifier.citation	AIP Conference Proceedings 1591, 614 (2014); doi: 10.1063/1.4872693	en_US
dc.identifier.uri	http://hdl.handle.net/123456789/47	-
dc.description.abstract	Photoluminescence (PL) technique was used for studying the defects in Copper Zinc Tin Sulphide (CZTS) thin films deposited by Chemical Spray Pyrolysis (CSP). Measurements were done on films prepared for different Cu:Zn:Sn:S ratios. An emission at 0.805 eV was monitored from 15 K to room temperature and activation energy was calculated. Excitation power dependent studies were done to analyze the type of transition.	en_US
dc.language.iso	en	en_US
dc.publisher	AIP Publishing	en_US
dc.subject	Photoluminescence	en_US
dc.subject	Defects	en_US
dc.subject	CZTS	en_US
dc.title	Photoluminescence studies on off-stoichiometric defects in sprayed CZTS thin films	en_US
dc.type	Article	en_US
Appears in Collections:	Conference Publications

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