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http://localhost:8082/xmlui/handle/123456789/42Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Deepu, D R | - |
| dc.contributor.author | Rajeshmon, V G | - |
| dc.contributor.author | Sudha Kartha, C | - |
| dc.contributor.author | Vijayakumar, K P | - |
| dc.date.accessioned | 2015-07-29T07:49:53Z | - |
| dc.date.available | 2015-07-29T07:49:53Z | - |
| dc.date.issued | 2014 | - |
| dc.identifier.citation | AIP Conf. Proc. 1591, 1666-1668 (2014) | en_US |
| dc.identifier.isbn | 978-0-7354-1225-5 | - |
| dc.identifier.uri | http://hdl.handle.net/123456789/42 | - |
| dc.description.abstract | XPS depth profile studies were carried out to analyze the composition and stoichiometry of sprayed CZTS thin films giving an efficiency of 1.85% in CZTS based thin film solar cell. Surface layers were nearly stoichiometric (Cu:Zn:Sn:S=2:1:1:4) whereas the inner layers were found to be Copper rich in composition making it electrically more conductive. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | AIP Publishing LLC | en_US |
| dc.subject | CZTS | en_US |
| dc.subject | X-ray photoelectron spectroscopy | en_US |
| dc.subject | Depth profiling | en_US |
| dc.title | XPS depth profile study of sprayed CZTS thin films | en_US |
| dc.type | Article | en_US |
| Appears in Collections: | Conference Publications | |
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