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http://localhost:8082/xmlui/handle/123456789/42| Title: | XPS depth profile study of sprayed CZTS thin films |
| Authors: | Deepu, D R Rajeshmon, V G Sudha Kartha, C Vijayakumar, K P |
| Keywords: | CZTS X-ray photoelectron spectroscopy Depth profiling |
| Issue Date: | 2014 |
| Publisher: | AIP Publishing LLC |
| Citation: | AIP Conf. Proc. 1591, 1666-1668 (2014) |
| Abstract: | XPS depth profile studies were carried out to analyze the composition and stoichiometry of sprayed CZTS thin films giving an efficiency of 1.85% in CZTS based thin film solar cell. Surface layers were nearly stoichiometric (Cu:Zn:Sn:S=2:1:1:4) whereas the inner layers were found to be Copper rich in composition making it electrically more conductive. |
| URI: | http://hdl.handle.net/123456789/42 |
| ISBN: | 978-0-7354-1225-5 |
| Appears in Collections: | Conference Publications |
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